연구성과로 돌아가기

2021 연구성과별 연구자 정보 (874 / 2991)

※ 현재 Web of Science 저자 정보만 집계되어 있습니다.
※ 컨트롤 + 클릭으로 열별 다중 정렬 가능합니다.
Excel 다운로드
Document Title Author Full Name Author Short Name Index Corresponding Address ResearcherID ResearcherID Author Name ORCID ORCID Author Name Related Email
Extraction of microplastics from commonly used sea salts in India and their toxicological evaluation Govarthanan, M. Govarthanan, M 9 교신저자 Kyungpook Natl Univ, Dept Environm Engn, Daegu 41566, South Korea C-1491-2014 Muthusamy, Govarthanan 0000-0001-8725-3059 Govarthanan, Muthusamy gova.muthu@gmail.com;kumarp@alagappauniversity.ac.in;
Extraction of microplastics from commonly used sea salts in India and their toxicological evaluation Kumar, P. Kumar, P 10 교신저자 Alagappa Univ, Dept Anim Hlth & Management, Toxicogen & Syst Toxicol Lab, Karaikkudi 630003, Tamil Nadu, India D-3470-2013 Ponnuchamy, Kumar 0000-0003-1496-8840 Ponnuchamy, Kumar gova.muthu@gmail.com;kumarp@alagappauniversity.ac.in;
Extreme points of Ls(²l∞) and P(²l∞) Guen, Kim Sung Guen, KS 1 교신저자 Kyungpook Natl Univ, Dept Math, Daegu 41566, South Korea sgk317@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Lee, Changmin Lee, C 1 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Lee, Won-Yong Lee, WY 2 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Kim, Do Won Kim, DW 3 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Kim, Hyeon Joong Kim, HJ 4 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea ABG-7715-2021 Kim, Byung Joo j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Bae, Jin-Hyuk Bae, JH 5 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Bae, Jin-Hyuk Bae, JH 5 Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Kang, In-Man Kang, IM 6 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Kang, In-Man Kang, IM 6 Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Lim, Doohyeok Lim, D 7 Kyonggi Univ, Dept Elect Engn, Suwon 16227, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Kim, Kwangeun Kim, K 8 Korea Aerosp Univ, Sch Elect & Informat Engn, Goyang 10540, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Jang, Jaewon Jang, J 9 교신저자 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
Extremely bias stress stable enhancement mode sol-gel-processed SnO2 thin-film transistors with Y2O3 passivation layers Jang, Jaewon Jang, J 9 교신저자 Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea j1jang@knu.ac.kr;
페이지 이동: