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| Document Title | Author Full Name | Author Short Name | Index | Corresponding | Address | ResearcherID | ResearcherID Author Name | ORCID | ORCID Author Name | Related Email |
|---|---|---|---|---|---|---|---|---|---|---|
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Bae, Youngho | Bae, Y | 5 | Uiduk Univ, Dept IT Convergence, Gyeongju 38004, South Korea | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||||
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Jung, Hyun-Wook | Jung, HW | 6 | Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea | F-6898-2013 | Jung, Hyun | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Kang, Soo Cheol | Kang, SC | 7 | Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea | 0000-0002-2244-1363 | Kang, Soo Cheol | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Kim, Haecheon | Kim, H | 8 | Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||||
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Noh, Youn-Sub | Noh, YS | 9 | Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||||
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Lee, Sang-Heung | Lee, SH | 10 | Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||||
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Kim, Seong-Il | Kim, SI | 11 | Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea | H-6157-2013 | Kim, Yong | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Ahn, Ho-Kyun | Ahn, HK | 12 | Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||||
| Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer | Lim, Jong-Won | Lim, JW | 13 | Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea | sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; | |||||
| Computation of Molecular Electron Affinities Using an Ensemble Density Functional Theory Method | Filatov, Michael | Filatov, M | 1 | 교신저자 | Kyungpook Natl Univ, Dept Chem, Daegu 702701, South Korea | mike.filatov@gmail.com;cheolho.choi@gmail.com; | ||||
| Computation of Molecular Electron Affinities Using an Ensemble Density Functional Theory Method | Lee, Seunghoon | Lee, S | 2 | CALTECH, Div Chem & Chem Engn, Pasadena, CA 91125 USA | AAB-4846-2021 | Lee, Seunghoon | 0000-0003-3665-587X | Lee, Seunghoon | mike.filatov@gmail.com;cheolho.choi@gmail.com; | |
| Computation of Molecular Electron Affinities Using an Ensemble Density Functional Theory Method | Nakata, Hiroya | Nakata, H | 3 | R&D Ctr Kagoshima, Kagoshima 8994312, Japan | V-3205-2018 | Nakata, Hiroya | mike.filatov@gmail.com;cheolho.choi@gmail.com; | |||
| Computation of Molecular Electron Affinities Using an Ensemble Density Functional Theory Method | Choi, Cheol Ho | Choi, CH | 4 | 교신저자 | Kyungpook Natl Univ, Dept Chem, Daegu 702701, South Korea | AAA-4705-2020 | Choi, Cheol Ho | 0000-0002-8757-1396 | Choi, Cheol Ho | mike.filatov@gmail.com;cheolho.choi@gmail.com; |
| Computation of Molecular Ionization Energies Using an Ensemble Density Functional Theory Method | Filatov, Michael | Filatov, M | 1 | 교신저자 | Kyungpook Natl Univ, Dept Chem, Daegu 702701, South Korea | mike.filatov@gmail.com;cheolho.choi@gmail.com; | ||||
| Computation of Molecular Ionization Energies Using an Ensemble Density Functional Theory Method | Lee, Seunghoon | Lee, S | 2 | CALTECH, Div Chem & Chem Engn, Pasadena, CA 91125 USA | AAB-4846-2021 | Lee, Seunghoon | 0000-0003-3665-587X | Lee, Seunghoon | mike.filatov@gmail.com;cheolho.choi@gmail.com; |
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