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Document Title Author Full Name Author Short Name Index Corresponding Address ResearcherID ResearcherID Author Name ⓘ ORCID ORCID Author Name Related Email
Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and Border Trap Densities of High-k Al2O3/In0.53Ga0.47As on a 300-mm Si Substrate ⓘ Amir, Walid ⓘ Amir, W ⓘ 1 Univ Ulsan, Sch Elect Engn, Ulsan 44610, South Korea ⓘ ⓘ ⓘ 0000-0002-2060-7104 ⓘ Amir, Walid ⓘ dae-hyun.kim@ee.knu.ac.kr;twkim78@ulsan.ac.kr; ⓘ
Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and Border Trap Densities of High-k Al2O3/In0.53Ga0.47As on a 300-mm Si Substrate ⓘ Kim, Dae-Hyun ⓘ Kim, DH ⓘ 2 교신저자 Kyungpook Natl Univ, Sch Elect Engn, Daegu 702701, South Korea ⓘ H-6157-2013 ⓘ Kim, Yong ⓘ ⓘ ⓘ dae-hyun.kim@ee.knu.ac.kr;twkim78@ulsan.ac.kr; ⓘ
Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and Border Trap Densities of High-k Al2O3/In0.53Ga0.47As on a 300-mm Si Substrate ⓘ Kim, Tae-Woo ⓘ Kim, TW ⓘ 3 교신저자 Univ Ulsan, Sch Elect Engn, Ulsan 44610, South Korea ⓘ ⓘ ⓘ 0000-0003-0234-5080 ⓘ Kim, Tae-Woo ⓘ dae-hyun.kim@ee.knu.ac.kr;twkim78@ulsan.ac.kr; ⓘ
Comprehensive in silico analysis of lactic acid bacteria for the selection of desirable probiotics ⓘ Vijayalakshmi, Selvakumar ⓘ Vijayalakshmi, S ⓘ 1 Kyungpook Natl Univ, Sch Food Sci & Biotechnol, Daegu 41566, South Korea ⓘ GON-9515-2022 ⓘ SELVAKUMAR, VIJAYALAKSHMI ⓘ 0000-0002-0348-4333 ⓘ SELVAKUMAR, VIJAYALAKSHMI ⓘ vijiselva10@gmail.com;atidamilare1@gmail.com;c3840@naver.com;parkmik@knu.ac.kr; ⓘ
Comprehensive in silico analysis of lactic acid bacteria for the selection of desirable probiotics ⓘ Adeyemi, Damilare Emmanuel ⓘ Adeyemi, DE ⓘ 2 Kyungpook Natl Univ, Sch Food Sci & Biotechnol, Daegu 41566, South Korea ⓘ ⓘ ⓘ 0000-0003-1939-7397 ⓘ Adeyemi, Damilare ⓘ vijiselva10@gmail.com;atidamilare1@gmail.com;c3840@naver.com;parkmik@knu.ac.kr; ⓘ
Comprehensive in silico analysis of lactic acid bacteria for the selection of desirable probiotics ⓘ Choi, In Young ⓘ Choi, IY ⓘ 3 Kyungpook Natl Univ, Sch Food Sci & Biotechnol, Daegu 41566, South Korea ⓘ ⓘ ⓘ ⓘ ⓘ vijiselva10@gmail.com;atidamilare1@gmail.com;c3840@naver.com;parkmik@knu.ac.kr; ⓘ
Comprehensive in silico analysis of lactic acid bacteria for the selection of desirable probiotics ⓘ Sultan, Ghazala ⓘ Sultan, G ⓘ 4 Aligarh Muslim Univ, Dept Comp Sci, Aligarh 202002, Uttar Pradesh, India ⓘ AAV-1745-2020 ⓘ Sultan, Ghazala ⓘ 0000-0001-8188-9304 ⓘ Sultan, Ghazala ⓘ vijiselva10@gmail.com;atidamilare1@gmail.com;c3840@naver.com;parkmik@knu.ac.kr; ⓘ
Comprehensive in silico analysis of lactic acid bacteria for the selection of desirable probiotics ⓘ Madar, Inamul Hasan ⓘ Madar, IH ⓘ 5 Bharathidasan Univ, Sch Biotechnol & Genet Engn, Dept Biotechnol, Tiruchirappalli 620024, Tamil Nadu, India ⓘ F-5762-2010 ⓘ Madar, Dr Inamul Hasan ⓘ 0000-0002-6913-1776 ⓘ Madar, Dr Inamul Hasan ⓘ vijiselva10@gmail.com;atidamilare1@gmail.com;c3840@naver.com;parkmik@knu.ac.kr; ⓘ
Comprehensive in silico analysis of lactic acid bacteria for the selection of desirable probiotics ⓘ Madar, Inamul Hasan ⓘ Madar, IH ⓘ 5 Islamiah Coll, Dept Biochem, Vaniyambadi 635751, Tamil Nadu, India ⓘ F-5762-2010 ⓘ Madar, Dr Inamul Hasan ⓘ 0000-0002-6913-1776 ⓘ Madar, Dr Inamul Hasan ⓘ vijiselva10@gmail.com;atidamilare1@gmail.com;c3840@naver.com;parkmik@knu.ac.kr; ⓘ
Comprehensive in silico analysis of lactic acid bacteria for the selection of desirable probiotics ⓘ Park, Mi-Kyung ⓘ Park, MK ⓘ 6 교신저자 Kyungpook Natl Univ, Sch Food Sci & Biotechnol, Daegu 41566, South Korea ⓘ J-9643-2017 ⓘ Park, Mi-Kyung ⓘ ⓘ ⓘ vijiselva10@gmail.com;atidamilare1@gmail.com;c3840@naver.com;parkmik@knu.ac.kr; ⓘ
Comprehensive in silico analysis of lactic acid bacteria for the selection of desirable probiotics ⓘ Park, Mi-Kyung ⓘ Park, MK ⓘ 6 교신저자 Kyungpook Natl Univ, Food & Bioind Res Inst, Daegu 41566, South Korea ⓘ J-9643-2017 ⓘ Park, Mi-Kyung ⓘ ⓘ ⓘ vijiselva10@gmail.com;atidamilare1@gmail.com;c3840@naver.com;parkmik@knu.ac.kr; ⓘ
Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer ⓘ Chang, Sung-Jae ⓘ Chang, SJ ⓘ 1 교신저자 Elect & Telecommun Res Inst, Convergence Res Dept, Def Mat & Components, Daejeon 34129, South Korea ⓘ ⓘ ⓘ ⓘ ⓘ sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; ⓘ
Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer ⓘ Kim, Dong-Seok ⓘ Kim, DS ⓘ 2 Korea Atom Energy Res Inst, Korea Multipurpose Accelerator Complex, Gyungju 38180, South Korea ⓘ ⓘ ⓘ ⓘ ⓘ sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; ⓘ
Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer ⓘ Kim, Tae-Woo ⓘ Kim, TW ⓘ 3 Univ Ulsan, Dept Elect Elect, Ulsan 44610, South Korea ⓘ ⓘ ⓘ 0000-0003-0234-5080 ⓘ Kim, Tae-Woo ⓘ sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; ⓘ
Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer ⓘ Lee, Jung-Hee ⓘ Lee, JH ⓘ 4 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea ⓘ ⓘ ⓘ ⓘ ⓘ sjchang@etri.re.kr;dongseokkim@kaeri.re.kr;twkim78@ulsan.ac.kr;jlee@ee.knu.ac.kr;yhbae@uu.ac.kr;hujung@etri.re.kr;kangsc817@etri.re.kr;khc@etri.re.kr;nohys@etri.re.kr;shl@etri.re.kr;sikim@etri.re.kr;hkahn@etri.re.kr;jwlim@etri.re.kr; ⓘ
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