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2022 연구성과별 연구자 정보 (1519 / 2879)

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Document Title Author Full Name Author Short Name Index Corresponding Address ResearcherID ResearcherID Author Name ORCID ORCID Author Name Related Email
Investigation of ultra-precision planing process to fabricate high luminance retroreflector based on cutting force and tool vibration analysis Han, Jun Sae Han, JS 2 Univ Sci & Technol UST, Dept Nano Mechatron Engn, Daejeon 34113, South Korea jtj@kimm.re.kr;
Investigation of ultra-precision planing process to fabricate high luminance retroreflector based on cutting force and tool vibration analysis Han, Jun Sae Han, JS 2 Korea Inst Machinery & Mat KIMM, Dept Nano Mfg Technol, Daejeon 34103, South Korea jtj@kimm.re.kr;
Investigation of ultra-precision planing process to fabricate high luminance retroreflector based on cutting force and tool vibration analysis Kang, Chung-Mo Kang, CM 3 Korea Inst Machinery & Mat KIMM, Dept Nano Mfg Technol, Daejeon 34103, South Korea jtj@kimm.re.kr;
Investigation of ultra-precision planing process to fabricate high luminance retroreflector based on cutting force and tool vibration analysis Kang, Chung-Mo Kang, CM 3 Kyungpook Natl Univ, Sch Mech Engn, Daegu 41566, South Korea jtj@kimm.re.kr;
Investigation of ultra-precision planing process to fabricate high luminance retroreflector based on cutting force and tool vibration analysis Gwak, Eun-Ji Gwak, EJ 4 Korea Inst Machinery & Mat KIMM, Dept Nano Mfg Technol, Daejeon 34103, South Korea jtj@kimm.re.kr;
Investigation of ultra-precision planing process to fabricate high luminance retroreflector based on cutting force and tool vibration analysis Choi, Doo-Sun Choi, DS 5 Korea Inst Machinery & Mat KIMM, Dept Nano Mfg Technol, Daejeon 34103, South Korea jtj@kimm.re.kr;
Investigation of ultra-precision planing process to fabricate high luminance retroreflector based on cutting force and tool vibration analysis Je, Tae-Jin Je, TJ 6 교신저자 Univ Sci & Technol UST, Dept Nano Mechatron Engn, Daejeon 34113, South Korea jtj@kimm.re.kr;
Investigation of ultra-precision planing process to fabricate high luminance retroreflector based on cutting force and tool vibration analysis Je, Tae-Jin Je, TJ 6 교신저자 Korea Inst Machinery & Mat KIMM, Dept Nano Mfg Technol, Daejeon 34103, South Korea jtj@kimm.re.kr;
Investigation on Atomic Bonding Structure of Solution-Processed Indium-Zinc-Oxide Semiconductors According to Doped Indium Content and Its Effects on the Transistor Performance Kim, Dongwook Kim, D 1 Hallym Univ, Dept Elect Engn, Chunchon 24252, South Korea jhbae@ee.knu.ac.kr;jaypark@hallym.ac.kr;
Investigation on Atomic Bonding Structure of Solution-Processed Indium-Zinc-Oxide Semiconductors According to Doped Indium Content and Its Effects on the Transistor Performance Lee, Hyeonju Lee, H 2 Hallym Univ, Dept Elect Engn, Chunchon 24252, South Korea jhbae@ee.knu.ac.kr;jaypark@hallym.ac.kr;
Investigation on Atomic Bonding Structure of Solution-Processed Indium-Zinc-Oxide Semiconductors According to Doped Indium Content and Its Effects on the Transistor Performance Kim, Bokyung Kim, B 3 Hallym Univ, Dept Elect Engn, Chunchon 24252, South Korea jhbae@ee.knu.ac.kr;jaypark@hallym.ac.kr;
Investigation on Atomic Bonding Structure of Solution-Processed Indium-Zinc-Oxide Semiconductors According to Doped Indium Content and Its Effects on the Transistor Performance Baang, Sungkeun Baang, S 4 Hallym Univ, Dept Elect Engn, Chunchon 24252, South Korea jhbae@ee.knu.ac.kr;jaypark@hallym.ac.kr;
Investigation on Atomic Bonding Structure of Solution-Processed Indium-Zinc-Oxide Semiconductors According to Doped Indium Content and Its Effects on the Transistor Performance Ejderha, Kadir Ejderha, K 5 Bingol Univ, Fac Sci & Arts, Dept Phys, TR-12000 Bingol, Turkey jhbae@ee.knu.ac.kr;jaypark@hallym.ac.kr;
Investigation on Atomic Bonding Structure of Solution-Processed Indium-Zinc-Oxide Semiconductors According to Doped Indium Content and Its Effects on the Transistor Performance Bae, Jin-Hyuk Bae, JH 6 교신저자 Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea jhbae@ee.knu.ac.kr;jaypark@hallym.ac.kr;
Investigation on Atomic Bonding Structure of Solution-Processed Indium-Zinc-Oxide Semiconductors According to Doped Indium Content and Its Effects on the Transistor Performance Bae, Jin-Hyuk Bae, JH 6 교신저자 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea jhbae@ee.knu.ac.kr;jaypark@hallym.ac.kr;
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