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2022 연구성과별 연구자 정보 (1447 / 2879)
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| Document Title | Author Full Name | Author Short Name | Index | Corresponding | Address | ResearcherID | ResearcherID Author Name | ORCID | ORCID Author Name | Related Email |
|---|---|---|---|---|---|---|---|---|---|---|
| Importance of CT image normalization in radiomics analysis: prediction of 3-year recurrence-free survival in non-small cell lung cancer | Jun, Johnson S. G. | Jun, JSG | 6 | D&P BIOTECH Inc, Seoul, South Korea | dosik.hwang@yonsei.ac.kr; | |||||
| Importance of CT image normalization in radiomics analysis: prediction of 3-year recurrence-free survival in non-small cell lung cancer | Hwang, Dosik | Hwang, D | 7 | 교신저자 | Yonsei Univ, Sch Elect & Elect Engn, Seoul, South Korea | dosik.hwang@yonsei.ac.kr; | ||||
| Importance of CT image normalization in radiomics analysis: prediction of 3-year recurrence-free survival in non-small cell lung cancer | Hwang, Dosik | Hwang, D | 7 | 교신저자 | Korea Inst Sci & Technol, Ctr Healthcare Robot, 5 Hwarang Ro 14 Gil, Seoul 02792, South Korea | dosik.hwang@yonsei.ac.kr; | ||||
| Importance of CT image normalization in radiomics analysis: prediction of 3-year recurrence-free survival in non-small cell lung cancer | Hwang, Dosik | Hwang, D | 7 | 교신저자 | Yonsei Univ, Coll Dent, Dept Oral & Maxillofacial Radiol, Seoul, South Korea | dosik.hwang@yonsei.ac.kr; | ||||
| Importance of CT image normalization in radiomics analysis: prediction of 3-year recurrence-free survival in non-small cell lung cancer | Hwang, Dosik | Hwang, D | 7 | 교신저자 | Yonsei Univ, Coll Med, Dept Radiol, Seoul, South Korea | dosik.hwang@yonsei.ac.kr; | ||||
| Importance of CT image normalization in radiomics analysis: prediction of 3-year recurrence-free survival in non-small cell lung cancer | Hwang, Dosik | Hwang, D | 7 | 교신저자 | Yonsei Univ, Coll Med, Ctr Clin Imaging Data Sci CCIDS, Seoul, South Korea | dosik.hwang@yonsei.ac.kr; | ||||
| Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors | Jeon, Sang-Hwa | Jeon, SH | 1 | Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea | jaypark@hallym.ac.kr;jhbae@ee.knu.ac.kr; | |||||
| Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors | Wang, Ziyuan | Wang, ZY | 2 | Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea | KIC-5864-2024 | Wang, Ziyuan | jaypark@hallym.ac.kr;jhbae@ee.knu.ac.kr; | |||
| Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors | Seo, Kyeong-Ho | Seo, KH | 3 | Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea | jaypark@hallym.ac.kr;jhbae@ee.knu.ac.kr; | |||||
| Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors | Feng, Junhao | Feng, JH | 4 | Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea | KZF-5875-2024 | Feng, Junhao | jaypark@hallym.ac.kr;jhbae@ee.knu.ac.kr; | |||
| Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors | Zhang, Xue | Zhang, X | 5 | Shangdong Univ Sci & Technol, Coll Ocean Sci & Engn, Qingdao 266590, Peoples R China | jaypark@hallym.ac.kr;jhbae@ee.knu.ac.kr; | |||||
| Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors | Park, Jaehoon | Park, J | 6 | 교신저자 | Hallym Univ, Dept Elect Engn, Chuncheon 24252, Peoples R China | jaypark@hallym.ac.kr;jhbae@ee.knu.ac.kr; | ||||
| Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors | Bae, Jin-Hyuk | Bae, JH | 7 | 교신저자 | Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea | 0000-0003-3217-1309 | Bae, Jin-Hyuk | jaypark@hallym.ac.kr;jhbae@ee.knu.ac.kr; | ||
| Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors | Bae, Jin-Hyuk | Bae, JH | 7 | 교신저자 | Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, Peoples R China | 0000-0003-3217-1309 | Bae, Jin-Hyuk | jaypark@hallym.ac.kr;jhbae@ee.knu.ac.kr; | ||
| Importance of Structural Relaxation on the Electrical Characteristics and Bias Stability of Solution-Processed ZnSnO Thin-Film Transistors | Hwang, Yu-Jin | Hwang, YJ | 1 | Kyungpook Natl Univ, Sch Elect & Elect Engn, 80 Daehakro, Daegu 41566, South Korea | jhbae@ee.knu.ac.kr; |
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