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| Document Title | Author Full Name | Author Short Name | Index | Corresponding | Address | ResearcherID | ResearcherID Author Name | ORCID | ORCID Author Name | Related Email |
|---|---|---|---|---|---|---|---|---|---|---|
| Nuclear security system effectiveness assessment using bounded analysis approach: a case study of different adversary scenarios | Syuryavin, Ahmad Ciptadi | Syuryavin, AC | 1 | 교신저자 | Kyungpook Natl Univ, Sch Energy Engn, Engn Bldg 7,Room 214,Daehak Ro 80, Daegu 41566, South Korea | 0000-0002-2047-0347 | Syuryavin, Ahmad Ciptadi | a.ciptadi@bapeten.go.id; | ||
| Nuclear security system effectiveness assessment using bounded analysis approach: a case study of different adversary scenarios | Syuryavin, Ahmad Ciptadi | Syuryavin, AC | 1 | 교신저자 | Badan Pengawas Tenaga Nuklir Nucl Energy Regulato, Jakarta, Indonesia | 0000-0002-2047-0347 | Syuryavin, Ahmad Ciptadi | a.ciptadi@bapeten.go.id; | ||
| Nuclear security system effectiveness assessment using bounded analysis approach: a case study of different adversary scenarios | Lee, Sang Hoon | Lee, SH | 2 | Kyungpook Natl Univ, Sch Energy Engn, Engn Bldg 7,Room 214,Daehak Ro 80, Daegu 41566, South Korea | a.ciptadi@bapeten.go.id; | |||||
| Nuclear security system effectiveness assessment using bounded analysis approach: a case study of different adversary scenarios | Lee, Sang Hoon | Lee, SH | 2 | Radiat Sci Res Inst RSRI, Daegu, South Korea | a.ciptadi@bapeten.go.id; | |||||
| Nuclear security system effectiveness assessment using bounded analysis approach: a case study of different adversary scenarios | Syam, Nur Syamsi | Syam, NS | 3 | Kyungpook Natl Univ, Sch Energy Engn, Engn Bldg 7,Room 214,Daehak Ro 80, Daegu 41566, South Korea | a.ciptadi@bapeten.go.id; | |||||
| Nuclear security system effectiveness assessment using bounded analysis approach: a case study of different adversary scenarios | Syam, Nur Syamsi | Syam, NS | 3 | Badan Pengawas Tenaga Nuklir Nucl Energy Regulato, Jakarta, Indonesia | a.ciptadi@bapeten.go.id; | |||||
| Numerical Analysis of Surface and Internal Discharge Phenomena at the Interface of Hetero-Dielectric Composites Based on the Migration-Migration Model | Kim, Minhee | Kim, M | 1 | Kyungpook Natl Univ, Dept Elect Engn, Daegu, South Korea | LRT-2058-2024 | Kim, Minhee | 0000-0002-4143-1830 | Kim, MinHee | shlees@knu.ac.kr; | |
| Numerical Analysis of Surface and Internal Discharge Phenomena at the Interface of Hetero-Dielectric Composites Based on the Migration-Migration Model | Kim, Su-Hun | Kim, SH | 2 | Kyungpook Natl Univ, Dept Elect Engn, Daegu, South Korea | AAB-5569-2020 | Kim, Su-Hun | shlees@knu.ac.kr; | |||
| Numerical Analysis of Surface and Internal Discharge Phenomena at the Interface of Hetero-Dielectric Composites Based on the Migration-Migration Model | Lee, Se-Hee | Lee, SH | 3 | 교신저자 | Kyungpook Natl Univ, Dept Elect Engn, Daegu, South Korea | shlees@knu.ac.kr; | ||||
| Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors | Park, Jihwan | Park, J | 1 | Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea | nrnr14@naver.com;kdk7362@naver.com;rudiny7144@naver.com;imkang@ee.knu.ac.kr;jljang@knu.ac.kr;fomalhout@gmail.com;lang@univ-paris-diderot.fr;jhbae@ee.knu.ac.kr; | |||||
| Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors | Kim, Do-Kyung | Kim, DK | 2 | Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea | nrnr14@naver.com;kdk7362@naver.com;rudiny7144@naver.com;imkang@ee.knu.ac.kr;jljang@knu.ac.kr;fomalhout@gmail.com;lang@univ-paris-diderot.fr;jhbae@ee.knu.ac.kr; | |||||
| Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors | Park, Jun-Ik | Park, JI | 3 | Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea | nrnr14@naver.com;kdk7362@naver.com;rudiny7144@naver.com;imkang@ee.knu.ac.kr;jljang@knu.ac.kr;fomalhout@gmail.com;lang@univ-paris-diderot.fr;jhbae@ee.knu.ac.kr; | |||||
| Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors | Kang, In Man | Kang, IM | 4 | Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea | nrnr14@naver.com;kdk7362@naver.com;rudiny7144@naver.com;imkang@ee.knu.ac.kr;jljang@knu.ac.kr;fomalhout@gmail.com;lang@univ-paris-diderot.fr;jhbae@ee.knu.ac.kr; | |||||
| Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors | Jang, Jaewon | Jang, J | 5 | Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea | 0000-0003-1908-0015 | Jang, Jaewon | nrnr14@naver.com;kdk7362@naver.com;rudiny7144@naver.com;imkang@ee.knu.ac.kr;jljang@knu.ac.kr;fomalhout@gmail.com;lang@univ-paris-diderot.fr;jhbae@ee.knu.ac.kr; | |||
| Numerical Analysis on Effective Mass and Traps Density Dependence of Electrical Characteristics of a-IGZO Thin-Film Transistors | Kim, Hyeok | Kim, H | 6 | Univ Seoul, Dept Elect & Comp Engn, Seoul 02504, South Korea | nrnr14@naver.com;kdk7362@naver.com;rudiny7144@naver.com;imkang@ee.knu.ac.kr;jljang@knu.ac.kr;fomalhout@gmail.com;lang@univ-paris-diderot.fr;jhbae@ee.knu.ac.kr; |
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