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| Document Title | Author Full Name | Author Short Name | Index | Corresponding | Address | ResearcherID | ResearcherID Author Name | ORCID | ORCID Author Name | Related Email |
|---|---|---|---|---|---|---|---|---|---|---|
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Nayak, M. | Nayak, M | 122 | Wayne State Univ, Detroit, MI 48202 USA | 0000-0002-2572-4692 | Nayak, Minakshi | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Nisar, N. K. | Nisar, NK | 123 | Univ Pittsburgh, Pittsburgh, PA 15260 USA | AAY-7200-2021 | Nellikunnummel, Nisar | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Nishida, S. | Nishida, S | 124 | SOKENDAI Grad Univ Adv Studies, Hayama, Kanagawa 2400193, Japan | 0000-0001-6373-2346 | Nishida, Shohei | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Nishida, S. | Nishida, S | 124 | High Energy Accelerator Res Org, KEK, Tsukuba, Ibaraki 3050801, Japan | 0000-0001-6373-2346 | Nishida, Shohei | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Nishimura, K. | Nishimura, K | 125 | Univ Hawaii, Honolulu, HI 96822 USA | ||||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Ogawa, K. | Ogawa, K | 126 | Niigata Univ, Niigata 9502181, Japan | ||||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Ono, H. | Ono, H | 127 | Nippon Dent Univ, Niigata 9518580, Japan | 0000-0003-4486-0064 | Ono, Hiroaki | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Ono, H. | Ono, H | 127 | Niigata Univ, Niigata 9502181, Japan | 0000-0003-4486-0064 | Ono, Hiroaki | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Onuki, Y. | Onuki, Y | 128 | Univ Tokyo, Dept Phys, Tokyo 1130033, Japan | ||||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Oskin, P. | Oskin, P | 129 | Russian Acad Sci, PN Lebedev Phys Inst, Moscow 119991, Russia | AAB-5345-2020 | Oskin, Pavel | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Pakhlov, P. | Pakhlov, P | 130 | Russian Acad Sci, PN Lebedev Phys Inst, Moscow 119991, Russia | K-2158-2013 | Pakhlov, Pavel | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Pakhlov, P. | Pakhlov, P | 130 | Moscow Phys Engn Inst, Moscow 115409, Russia | K-2158-2013 | Pakhlov, Pavel | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Pakhlova, G. | Pakhlova, G | 131 | Russian Acad Sci, PN Lebedev Phys Inst, Moscow 119991, Russia | C-5378-2014 | Pakhlova, Galina | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Pakhlova, G. | Pakhlova, G | 131 | Moscow Inst Phys & Technol, Dolgoprudnyi 141700, Moscow Region, Russia | C-5378-2014 | Pakhlova, Galina | ||||
| Measurement of R(D) and R(D*) with a Semileptonic Tagging Method | Pal, B. | Pal, B | 132 | Brookhaven Natl Lab, Upton, NY 11973 USA |
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