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2022 연구자 정보 (961 / 1074)

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Author Name 제1저자 여부 교신저자 여부 Address ResearcherID ORCID Paper Title WoS Edition 최상위 JCR(%) WoS Category Related Email
Kim, Dae-geun
(Kim, DG)
Kyungpook Natl Univ, Dept Architectural Civil Environm & Energy Engn, Daegu 41566, South Korea

[JCR상위 77.2] The Measurement of Construction Error Technology for Deformable Modular System by Image Processing SCIE 77.2 CONSTRUCTION & BUILDING TECHNOLOGY;ENGINEERING, CIVIL lhdza@knu.ac.kr;
Kim, Hong-Jin
(Kim, HJ)
Kyungpook Natl Univ, Dept Architectural Civil Environm & Energy Engn, Daegu 41566, South Korea

[JCR상위 77.2] The Measurement of Construction Error Technology for Deformable Modular System by Image Processing SCIE 77.2 CONSTRUCTION & BUILDING TECHNOLOGY;ENGINEERING, CIVIL lhdza@knu.ac.kr;
Lee, Hee-Du
(Lee, HD)
교신저자 Kyungpook Natl Univ, Dept Architectural Civil Environm & Energy Engn, Daegu 41566, South Korea

[JCR상위 77.2] The Measurement of Construction Error Technology for Deformable Modular System by Image Processing SCIE 77.2 CONSTRUCTION & BUILDING TECHNOLOGY;ENGINEERING, CIVIL lhdza@knu.ac.kr;
Shin, Kyung-Jae
(Shin, KJ)
Kyungpook Natl Univ, Dept Architectural Civil Environm & Energy Engn, Daegu 41566, South Korea

[JCR상위 77.2] The Measurement of Construction Error Technology for Deformable Modular System by Image Processing SCIE 77.2 CONSTRUCTION & BUILDING TECHNOLOGY;ENGINEERING, CIVIL lhdza@knu.ac.kr;
Woo, Jong-Hun
(Woo, JH)
제1저자 Kyungpook Natl Univ, Dept Architectural Civil Environm & Energy Engn, Daegu 41566, South Korea
0000-0003-2777-9037
WOO, JONGHUN
[JCR상위 77.2] The Measurement of Construction Error Technology for Deformable Modular System by Image Processing SCIE 77.2 CONSTRUCTION & BUILDING TECHNOLOGY;ENGINEERING, CIVIL lhdza@knu.ac.kr;
Bin Tufail, Ahsan
(Bin Tufail, A)
Harbin Inst Technol, Sch Elect & Informat Engn, Harbin 150001, Peoples R China
COMSATS Univ Islamabad, Dept Elect & Comp Engn, Sahiwal Campus, Sahiwal, Pakistan


[JCR상위 77.3] 3D convolutional neural networks based automatic modulation classification in the presence of channel noise SCIE 77.3 ENGINEERING, ELECTRICAL & ELECTRONIC yq@hit.edu.cn;
Cengiz, Korhan
(Cengiz, K)
Trakya Univ, Dept Elect Elect Engn, Edirne, Turkey HTN-8060-2023
Cengiz, Korhan
0000-0001-6594-8861
Cengiz, Korhan
[JCR상위 77.3] 3D convolutional neural networks based automatic modulation classification in the presence of channel noise SCIE 77.3 ENGINEERING, ELECTRICAL & ELECTRONIC yq@hit.edu.cn;
Khan, Rahim
(Khan, R)
제1저자 Harbin Inst Technol, Sch Elect & Informat Engn, Harbin 150001, Peoples R China
0000-0002-0928-915X
Khan, Rahim
[JCR상위 77.3] 3D convolutional neural networks based automatic modulation classification in the presence of channel noise SCIE 77.3 ENGINEERING, ELECTRICAL & ELECTRONIC yq@hit.edu.cn;
Noor, Alam
(Noor, A)
Politecn Porto, ISEP, CISTER Res Ctr, Porto, Portugal B-2353-2019
Noor, Alam
0000-0002-0077-6509
NOOR, ALAM
[JCR상위 77.3] 3D convolutional neural networks based automatic modulation classification in the presence of channel noise SCIE 77.3 ENGINEERING, ELECTRICAL & ELECTRONIC yq@hit.edu.cn;
Rehman, Abdul
(Rehman, A)
Kyungpook Natl Univ, Dept Comp Sci & Engn, Daegu, South Korea
Univ Cent Punjab, Fac Media & Commun Studies, Lahore, Pakistan
D-5630-2019
Rehman, Abdul
0000-0002-9343-7652
Rehman, Abdul
[JCR상위 77.3] 3D convolutional neural networks based automatic modulation classification in the presence of channel noise SCIE 77.3 ENGINEERING, ELECTRICAL & ELECTRONIC yq@hit.edu.cn;
Rehman, Ateeq Ur
(Rehman, AU)
Govt Coll Univ, Dept Elect Engn, Lahore, Pakistan ABI-7516-2020
REHMAN, ATEEQ

[JCR상위 77.3] 3D convolutional neural networks based automatic modulation classification in the presence of channel noise SCIE 77.3 ENGINEERING, ELECTRICAL & ELECTRONIC yq@hit.edu.cn;
Ullah, Inam
(Ullah, I)
Hohai Univ HHU, Coll Internet Things IoT Engn, Changzhou Campus, Changzhou, Jiangsu, Peoples R China Z-3617-2019
Ullah, Inam
0000-0002-5879-569X
ULLAH, INAM
[JCR상위 77.3] 3D convolutional neural networks based automatic modulation classification in the presence of channel noise SCIE 77.3 ENGINEERING, ELECTRICAL & ELECTRONIC yq@hit.edu.cn;
Yang, Qiang
(Yang, Q)
교신저자 Harbin Inst Technol, Sch Elect & Informat Engn, Harbin 150001, Peoples R China

[JCR상위 77.3] 3D convolutional neural networks based automatic modulation classification in the presence of channel noise SCIE 77.3 ENGINEERING, ELECTRICAL & ELECTRONIC yq@hit.edu.cn;
Kim, Byoung-Joon
(Kim, BJ)
Kyungpook Natl Univ, Sch Med, Dept Radiol, Dept Neurosurg, Daegu, South Korea
Kyungpook Natl Univ, Sch Med, Dept Neurosurg, Daegu, South Korea

0000-0002-9375-1799
Kim, Byoung-Joon
[JCR상위 77.6] Retrospective 6 month-outcomes and prognostic factors following spontaneous angiogram-negative non-perimesencephalic subarachnoid hemorrhage
[JCR상위 68.3] True Posterior Communicating Artery Aneurysms with High Risk of Rupture despite Very Small Diameter
[JCR상위 42.7] Frictional force analysis of stent retriever devices using a realistic vascular model: Pilot study
SCIE 42.7 CLINICAL NEUROLOGY;NEUROSCIENCES
CLINICAL NEUROLOGY;SURGERY
kdhdock@gmail.com;
jparkmd@hotmail.com;
joonwon@postech.ac.kr;kdhdock@hotmail.com;
Kim, Myungsoo
(Kim, M)
제1저자 Kyungpook Natl Univ, Sch Med, Dept Radiol, Dept Neurosurg, Daegu, South Korea
Kyungpook Natl Univ, Sch Med, Dept Neurosurg, Daegu, South Korea

0000-0003-2764-2508
Kim, Myungsoo
[JCR상위 77.6] Retrospective 6 month-outcomes and prognostic factors following spontaneous angiogram-negative non-perimesencephalic subarachnoid hemorrhage
[JCR상위 68.3] True Posterior Communicating Artery Aneurysms with High Risk of Rupture despite Very Small Diameter
[JCR상위 42.7] Frictional force analysis of stent retriever devices using a realistic vascular model: Pilot study
SCIE 42.7 CLINICAL NEUROLOGY;NEUROSCIENCES
CLINICAL NEUROLOGY;SURGERY
kdhdock@gmail.com;
jparkmd@hotmail.com;
joonwon@postech.ac.kr;kdhdock@hotmail.com;
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