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2023 연구자 정보 (812 / 1135)

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Author Name 제1저자 여부 교신저자 여부 Address ResearcherID ORCID Paper Title WoS Edition 최상위 JCR(%) WoS Category Related Email
Hwang, Joon
(Hwang, J)
Seoul Natl Univ, Interuniv Semicond Res Ctr, Dept Elect & Comp Engn, Seoul 08826, South Korea
0000-0003-2998-8174
Hwang, Joon
[JCR상위 32.7] Super-steep synapses based on positive feedback devices for reliable binary neural networks SCIE 32.7 PHYSICS, APPLIED sywoo@knu.ac.kr;jhl@snu.ac.kr;
Im, Jong-Pil
(Im, JP)
Elect & Telecommun Res Inst, Emerging Nanomat Res Sect, Daejeon 34129, South Korea

[JCR상위 32.7] Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor SCIE 32.7 PHYSICS, APPLIED jiyong.woo@knu.ac.kr;orion627@korea.ac.kr;
Jang, Hyunmi
(Jang, H)
Pusan Natl Univ, Grad Sch Int Studies, Busan, South Korea

[JCR상위 32.7] The performance of major airports in the Europe, North America and Asia SSCI 32.7 BUSINESS pridejw@gmail.com;saeyeon.roh@plymouth.ac.uk;jangh01@pusan.ac.kr;y.seo@knu.ac.kr;
Jeon, Juye
(Jeon, J)
Korea Univ, Dept Elect & Informat Engn, 2511 Sejong Ro, Sejong 30019, South Korea
Samsung Elect Co Ltd, Yogin Si 17133, Gyeonggi Do, South Korea


[JCR상위 32.7] Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor SCIE 32.7 PHYSICS, APPLIED jiyong.woo@knu.ac.kr;orion627@korea.ac.kr;
Jin, Seunghee
(Jin, S)
제1저자 Korea Univ, Dept Elect & Informat Engn, 2511 Sejong Ro, Sejong 30019, South Korea

[JCR상위 32.7] Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor SCIE 32.7 PHYSICS, APPLIED jiyong.woo@knu.ac.kr;orion627@korea.ac.kr;
Kadam, Suhas Kishor
(Kadam, SK)
Kyungpook Natl Univ, Res Inst Dok Do & Ulleung Do Isl, Sch Life Sci, Dept Biol, Daegu, South Korea HNI-6437-2023
Kadam, Dr Suhas
0000-0002-2396-4932
Kadam, Dr Suhas
[JCR상위 32.7] Multifarious microbial biostimulants promote growth in Arachis hypogaea L. SCIE 32.7 FOOD SCIENCE & TECHNOLOGY lara9k@gmail.com;tcsiang@kpjuc.edu.my;
Kim, Hyeongsu
(Kim, H)
Seoul Natl Univ, Interuniv Semicond Res Ctr, Dept Elect & Comp Engn, Seoul 08826, South Korea
Konkuk Univ, Sch Med, Dept Prevent Med, Seoul, South Korea

0000-0002-4157-5340
Kim, Hyeongsu
[JCR상위 32.7] Super-steep synapses based on positive feedback devices for reliable binary neural networks
[JCR상위 46.7] Korea Seroprevalence Study of Monitoring of SARS-COV-2 Antibody Retention and Transmission (K-SEROSMART): findings from national representative sample
SCIE 32.7 PHYSICS, APPLIED
PUBLIC, ENVIRONMENTAL & OCCUPATIONAL HEALTH
sywoo@knu.ac.kr;jhl@snu.ac.kr;
solee5301@gmail.com;dhkims@hallym.ac.kr;
Kim, Jeong Hun
(Kim, JH)
Elect & Telecommun Res Inst, Emerging Nanomat Res Sect, Daejeon 34129, South Korea

[JCR상위 32.7] Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor SCIE 32.7 PHYSICS, APPLIED jiyong.woo@knu.ac.kr;orion627@korea.ac.kr;
Kwon, Dongseok
(Kwon, D)
제1저자 Seoul Natl Univ, Interuniv Semicond Res Ctr, Dept Elect & Comp Engn, Seoul 08826, South Korea JDC-8584-2023
Kwon, Dongseok
0000-0001-7676-8938
Kwon, Dongseok
[JCR상위 32.7] Super-steep synapses based on positive feedback devices for reliable binary neural networks SCIE 32.7 PHYSICS, APPLIED sywoo@knu.ac.kr;jhl@snu.ac.kr;
Lee, Chang Seung
(Lee, CS)
Samsung Adv Inst Technol, Thin Film Tech Unit, Suwon 16678, South Korea

[JCR상위 32.7] Understanding ovonic threshold switching of GeSe chalcogenide materials using electrical methodologies for extracting density of states SCIE 32.7 PHYSICS, APPLIED jiyong.woo@knu.ac.kr;drlift@kookmin.ac.kr;
Lee, Hee Jun
(Lee, HJ)
Kookmin Univ, Sch Elect Engn, Seoul 02707, South Korea AAN-9070-2021
Lee, Heejun

[JCR상위 32.7] Understanding ovonic threshold switching of GeSe chalcogenide materials using electrical methodologies for extracting density of states SCIE 32.7 PHYSICS, APPLIED jiyong.woo@knu.ac.kr;drlift@kookmin.ac.kr;
Lee, Jong-Ho
(Lee, JH)
교신저자 Minist Sci & ICT, Sejong, South Korea
Seoul Natl Univ, Sch Dent, Dept Oral & Maxillofacial Surg, Seoul, South Korea
AAV-8920-2020
Lee, Jingyu

[JCR상위 32.7] Super-steep synapses based on positive feedback devices for reliable binary neural networks
[JCR상위 71.4] Facial Asymmetry Phenotypes in Adult Patients With Unilateral Cleft Lip and Palate and Skeletal Class III Malocclusion Using Principal Component Analysis and Cluster Analysis
SCIE 32.7 PHYSICS, APPLIED
SURGERY
sywoo@knu.ac.kr;jhl@snu.ac.kr;
mhhong1208@gmail.com;totjt1@gmail.com;drortho@snu.ac.kr;jinychoi@snu.ac.kr;leejongh@snu.ac.kr;myungkim@snu.ac.kr;66012@snuh.org;kimsw55@cha.ac.kr;drwhite@unitel.co.kr;
Lee, Kyu-Ho
(Lee, KH)
Seoul Natl Univ, Interuniv Semicond Res Ctr, Dept Elect & Comp Engn, Seoul 08826, South Korea

[JCR상위 32.7] Super-steep synapses based on positive feedback devices for reliable binary neural networks SCIE 32.7 PHYSICS, APPLIED sywoo@knu.ac.kr;jhl@snu.ac.kr;
Lee, Yong Min
(Lee, YM)
Daegu Gyeongbuk Inst Sci & Technol DGIST, Dept Energy Sci & Engn, Daegu 42988, South Korea
Daegu Gyeongbuk Inst Sci & Technol DGIST, Energy Sci & Engn Res Ctr, Daegu 42988, South Korea
LTY-8230-2024
Lee, YongMin

[JCR상위 32.7] Phase-field analysis of the effects of particle size, diffusivities, and mechanical properties on the cracking of silicon nanoparticle SCIE 32.7 PHYSICS, APPLIED sykim.knu@gmail.com;
Moon, Seung Eon
(Moon, SE)
Univ Sci & Technol, Dept Adv Device Engn, Daejeon 34113, South Korea

[JCR상위 32.7] Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor SCIE 32.7 PHYSICS, APPLIED jiyong.woo@knu.ac.kr;orion627@korea.ac.kr;
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