연구성과로 돌아가기

2024 연구자 정보 (1023 / 1079)

※ 컨트롤 + 클릭으로 열별 다중 정렬 가능합니다.
Excel 다운로드
Author Name 제1저자 여부 ⓘ 교신저자 여부 ⓘ Address ResearcherID ORCID Paper Title WoS Edition 최상위 JCR(%) WoS Category Related Email
Nakamura, K. R.
(Nakamura, KR) ⓘ 		High Energy Accelerator Res Org KEK, Tsukuba 3050801, Japan
Grad Univ Adv Studies SOKENDAI, Hayama 2400193, Japan
High Energy Accelerator Res Org KEK, Tsukuba, Ibaraki 3050801, Japan ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Silicon vertex detector of the Belle II experiment
[JCR상위 57.3] The Silicon Vertex Detector of the Belle II experiment ⓘ 		SCIE ⓘ 57.3 INSTRUMENTS & INSTRUMENTATION
INSTRUMENTS & INSTRUMENTATION;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, NUCLEAR;PHYSICS, PARTICLES & FIELDS ⓘ 		suryamondal@gmail.com;
zihanwa@hep.phys.s.u-tokyo.ac.jp; ⓘ
Nam, S. H.
(Nam, SH) ⓘ 		ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Performance of the prototype beam drift chamber for LAMPS at RAON with proton and 12C beams ⓘ SCIE ⓘ 75.3 INSTRUMENTS & INSTRUMENTATION ⓘ dhmoon@chonnam.ac.kr; ⓘ
Nam, U. W.
(Nam, UW) ⓘ 		Korea Astron & Space Sci Inst, Space Sci Div, Daejeon 34055, South Korea
Korea Astron & Space Sci Inst, Space Sci Div, Daejeon, South Korea ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Effect of temperature on the scintillation properties of pure LaCl3 and Cs2LiYCl6:Ce crystals for neutron spectroscopy
[JCR상위 6.1] Study on scintillation properties and proton-induced radiation damage of LaCl3 crystals
[JCR상위 57.3] Proton-induced radiation damage in Cs2LiYCl6:Ce scintillator ⓘ 		SCIE ⓘ 6.1 INSTRUMENTS & INSTRUMENTATION
CHEMISTRY, PHYSICAL;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, ATOMIC, MOLECULAR & CHEMICAL
INSTRUMENTS & INSTRUMENTATION;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, NUCLEAR;PHYSICS, PARTICLES & FIELDS ⓘ 		hongjoo@knu.ac.kr;
sunshine@knu.ac.kr; ⓘ
Natkaniec, Z.
(Natkaniec, Z) ⓘ 		ⓘ AAP-2995-2021
Natkaniec, Zbigniew ⓘ
ⓘ 		[JCR상위 75.3] Silicon vertex detector of the Belle II experiment
[JCR상위 57.3] The Silicon Vertex Detector of the Belle II experiment ⓘ 		SCIE ⓘ 57.3 INSTRUMENTS & INSTRUMENTATION
INSTRUMENTS & INSTRUMENTATION;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, NUCLEAR;PHYSICS, PARTICLES & FIELDS ⓘ 		suryamondal@gmail.com;
zihanwa@hep.phys.s.u-tokyo.ac.jp; ⓘ
Onuki, Y.
(Onuki, Y) ⓘ 		ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Silicon vertex detector of the Belle II experiment
[JCR상위 57.3] The Silicon Vertex Detector of the Belle II experiment ⓘ 		SCIE ⓘ 57.3 INSTRUMENTS & INSTRUMENTATION
INSTRUMENTS & INSTRUMENTATION;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, NUCLEAR;PHYSICS, PARTICLES & FIELDS ⓘ 		suryamondal@gmail.com;
zihanwa@hep.phys.s.u-tokyo.ac.jp; ⓘ
Otani, F.
(Otani, F) ⓘ 		ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Silicon vertex detector of the Belle II experiment
[JCR상위 57.3] The Silicon Vertex Detector of the Belle II experiment ⓘ 		SCIE ⓘ 57.3 INSTRUMENTS & INSTRUMENTATION
INSTRUMENTS & INSTRUMENTATION;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, NUCLEAR;PHYSICS, PARTICLES & FIELDS ⓘ 		suryamondal@gmail.com;
zihanwa@hep.phys.s.u-tokyo.ac.jp; ⓘ
Pak, Sangyeon
(Pak, S) ⓘ 		Hongik Univ, Sch Elect & Elect Engn, Seoul 04066, South Korea ⓘ AHE-6721-2022
Pak, Sangyeon ⓘ 		0000-0003-1765-3043
Pak, Sangyeon ⓘ 		[JCR상위 75.3] Deep spiking neural networks with integrate and fire neuron using steep switching device ⓘ SCIE ⓘ 75.3 ENGINEERING, ELECTRICAL & ELECTRONIC;PHYSICS, APPLIED;PHYSICS, CONDENSED MATTER ⓘ sywoo@knu.ac.kr;spak@hongik.ac.kr;lst777@hongik.ac.kr; ⓘ
Paladino, A.
(Paladino, A) ⓘ 		교신저자 INFN Sez Bologna, I-40127 Bologna, Italy
INFN Sez Pisa, I-56127 Pisa, Italy ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Silicon vertex detector of the Belle II experiment
[JCR상위 57.3] The Silicon Vertex Detector of the Belle II experiment ⓘ 		SCIE ⓘ 57.3 INSTRUMENTS & INSTRUMENTATION
INSTRUMENTS & INSTRUMENTATION;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, NUCLEAR;PHYSICS, PARTICLES & FIELDS ⓘ 		suryamondal@gmail.com;
zihanwa@hep.phys.s.u-tokyo.ac.jp; ⓘ
Paoloni, E.
(Paoloni, E) ⓘ 		INFN Sez Pisa, I-56127 Pisa, Italy ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Silicon vertex detector of the Belle II experiment
[JCR상위 57.3] The Silicon Vertex Detector of the Belle II experiment ⓘ 		SCIE ⓘ 57.3 INSTRUMENTS & INSTRUMENTATION
INSTRUMENTS & INSTRUMENTATION;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, NUCLEAR;PHYSICS, PARTICLES & FIELDS ⓘ 		suryamondal@gmail.com;
zihanwa@hep.phys.s.u-tokyo.ac.jp; ⓘ
Park, Byeong-Gyu
(Park, BG) ⓘ 		Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Bridge-contact resistance method for precise evaluation of electrical contacts of nano-scale semiconductor devices ⓘ SCIE ⓘ 75.3 ENGINEERING, ELECTRICAL & ELECTRONIC;PHYSICS, APPLIED;PHYSICS, CONDENSED MATTER ⓘ hp@etri.re.kr;hpark@ee.knu.ac.kr; ⓘ
Park, H.
(Park, H) ⓘ 		교신저자 Kyungpook Natl Univ, Dept Phys, Daegu 41566, South Korea
Kyungpook Natl Univ, Dept Phys, Daegu, South Korea ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Separation of planar and edge contributions to total capacitance for accurate doping concentration determination in square silicon photodiodes
[JCR상위 6.1] Study on scintillation properties and proton-induced radiation damage of LaCl3 crystals
[JCR상위 42.5] X-ray beam test of fabricated photo-diodes for Pohang-Accelerator-Laboratory X-ray free-electron laser
[JCR상위 32.7] The cosmic ray energetics and mass for the international space station (ISS-CREAM) instrument
[JCR상위 75.3] Silicon vertex detector of the Belle II experiment
[JCR상위 57.3] The Silicon Vertex Detector of the Belle II experiment ⓘ 		SCIE ⓘ 6.1 INSTRUMENTS & INSTRUMENTATION
CHEMISTRY, PHYSICAL;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, ATOMIC, MOLECULAR & CHEMICAL
PHYSICS, MULTIDISCIPLINARY
ASTRONOMY & ASTROPHYSICS;PHYSICS, PARTICLES & FIELDS
INSTRUMENTS & INSTRUMENTATION;NUCLEAR SCIENCE & TECHNOLOGY;PHYSICS, NUCLEAR;PHYSICS, PARTICLES & FIELDS ⓘ 		sunshine@knu.ac.kr;
hjhyun@postech.ac.kr;
ysy@kriss.re.kr;seo@umd.edu;
suryamondal@gmail.com;
zihanwa@hep.phys.s.u-tokyo.ac.jp; ⓘ
Park, Honghwi
(Park, H) ⓘ 		교신저자 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea
Elect & Telecommun Res Inst ETRI, Photon Wireless Devices Res Div, Daejeon 34129, South Korea ⓘ 		KIC-1871-2024
Park, Honghwi ⓘ
ⓘ 		[JCR상위 75.3] Bridge-contact resistance method for precise evaluation of electrical contacts of nano-scale semiconductor devices ⓘ SCIE ⓘ 75.3 ENGINEERING, ELECTRICAL & ELECTRONIC;PHYSICS, APPLIED;PHYSICS, CONDENSED MATTER ⓘ hp@etri.re.kr;hpark@ee.knu.ac.kr; ⓘ
Park, Hongsik
(Park, H) ⓘ 		교신저자 Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea
Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Bridge-contact resistance method for precise evaluation of electrical contacts of nano-scale semiconductor devices
[JCR상위 23.2] Displacement damage effect of proton irradiation on vertical (3-Ga2O3 and SiC Schottky barrier diodes (SBDs)
[JCR상위 32.5] High on/off ratio SiO2-based memristors for neuromorphic computing: understanding the switching mechanisms through theoretical and electrochemical aspects ⓘ 		SCIE
ESCI ⓘ 		23.2 ENGINEERING, ELECTRICAL & ELECTRONIC;PHYSICS, APPLIED;PHYSICS, CONDENSED MATTER
MATERIALS SCIENCE, MULTIDISCIPLINARY;NANOSCIENCE & NANOTECHNOLOGY
MATERIALS SCIENCE, MULTIDISCIPLINARY ⓘ 		hp@etri.re.kr;hpark@ee.knu.ac.kr;
yjyoon@anu.ac.kr;jaehwaseo@keri.re.kr;
sunghlee@purdue.edu; ⓘ
Park, S. D.
(Park, SD) ⓘ 		제1저자 Kyungpook Natl Univ, Dept Phys, 80 Daehak Ro, Daegu 41566, South Korea
Kyungpook Natl Univ, Dept Phys Educ, Daegu 41566, South Korea
Kyungpook Natl Univ, Dept Phys, Daegu 41566, South Korea ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Investigation of scintillation properties of a CsI(Tl) crystal at low temperature for dark matter search
[JCR상위 32.7] Alpha backgrounds in NaI(Tl) crystals of COSINE-100
[JCR상위 24.2] Nonproportionality of NaI(Tl) scintillation detector for dark matter search experiments
[JCR상위 75.3] Lowering threshold of NaI(Tl) scintillator to 0.7 keV in the COSINE-100 experiment ⓘ 		SCIE ⓘ 24.2 INSTRUMENTS & INSTRUMENTATION
ASTRONOMY & ASTROPHYSICS;PHYSICS, PARTICLES & FIELDS
PHYSICS, PARTICLES & FIELDS ⓘ 		hongjoo@knu.ac.kr;
ejjeon@ibs.re.kr;mkauer@physics.wisc.edu;gksmrf222333@naver.com;tksxk752@naver.com;
yjko@ibs.re.kr; ⓘ
Park, Youngjin
(Park, Y) ⓘ 		Kyungpook Natl Univ, Sch Elect & Elect Engn, Daegu 41566, South Korea ⓘ
ⓘ
ⓘ 		[JCR상위 75.3] Bridge-contact resistance method for precise evaluation of electrical contacts of nano-scale semiconductor devices ⓘ SCIE ⓘ 75.3 ENGINEERING, ELECTRICAL & ELECTRONIC;PHYSICS, APPLIED;PHYSICS, CONDENSED MATTER ⓘ hp@etri.re.kr;hpark@ee.knu.ac.kr; ⓘ
페이지 이동: